Atomic Force Microscope for X-Ray Beamlines

The use of Atomic Force Microscopy supplements synchrotron radiation techniques in issues relevant to nanotechnology, and opens new possibilities in the analyses performed with synchrotron radiation.

X-AFM -functionalities
- High resolution sample topography measurement.
- Measurement in tilted position.
- Easy implementation on the beamline.
- Nano structure alignment with the X-ray beam.
- Local photon and/or electron detection.
- Possibility of mechanical modification of the sample.
- Local application of mechanical stress.

X–AFM has been developed as an Atomic Force Microscope that can be installed and used in any existing X-ray beamline.

In situ combination of X-ray experiments and Atomic Force Microscopy imaging.

It offers the possibility of locating nano objects or nano features on a sample and aligning them to the X-ray beam.

This new microscope has the ability to obtain surface morphology with a resolution of few nanometers without any beamline modification.