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Local detection of X-ray spectroscopies with an in-situ Atomic Force Microscope M.S. Rodrigues, O. Dhez, S. Le Denmat, J. Chevrier, R. Felici and F. Comin Journal of instrumentation |
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Probing the elastic properties of individual nanostructures by combining in-situ Atomic Force Microscopy and micro X-ray Diffraction T. Scheler, M. Rodrigues, T. W. Cornelius, C. Mocuta, A. Malachias, R. Magalhães-Paniago, F. Comin, J. Chevrier and T. H. Metzger Applied Physics Letters |