Mechanical modification and indentation

The SPM tip can be used as a nano-indenter which can locally probe mechanical properties of particles on the surface.

High-accuracy alignment of the AFM tip and the X-ray Beam

The images show the map of the current generated by the X-ray beam impinging on the AFM tip apex and on the detector. The red color shows the high current and the blue color the low current. This gives us the ability to detect the X-ray beam and accurately align the beam with the nano object.

X-ray Diffraction
Structural information about studied material

AFM
Direct morphology information, precise alignment of studied object and X-ray beam.

Both techniques can be employed simultaneously with nanometric precision.

New possibility to observe the evolution of the diffraction signal induced by mechanical interaction with studied nano structure.